Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media

J. Kawaji; T. Asahi; H. Hashimoto; J. Hokkyo; T. Osaka; S. Matsunuma; G. Sáfrán; J. Ariake; K. Ouchi

doi:10.1063/1.1736324

Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media

J. Kawaji^*, T. Asahi, H. Hashimoto, J. Hokkyo, T. Osaka, S. Matsunuma, G. Sáfrán, J. Ariake, K. Ouchi

^*Corresponding author for this work

School of Advanced Science and Engineering

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N₂ and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N₂ gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.

Original language	English
Pages (from-to)	8023-8029
Number of pages	7
Journal	Journal of Applied Physics
Volume	95
Issue number	12
DOIs	https://doi.org/10.1063/1.1736324
Publication status	Published - 2004 Jun 15

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.1736324

Cite this

@article{c2504c63bbf84688be9973ddd3c94d88,

title = "Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media",

abstract = "The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N2 and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N2 gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.",

author = "J. Kawaji and T. Asahi and H. Hashimoto and J. Hokkyo and T. Osaka and S. Matsunuma and G. S{\'a}fr{\'a}n and J. Ariake and K. Ouchi",

year = "2004",

month = jun,

day = "15",

doi = "10.1063/1.1736324",

language = "English",

volume = "95",

pages = "8023--8029",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "12",

}

TY - JOUR

T1 - Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media

AU - Kawaji, J.

AU - Asahi, T.

AU - Hashimoto, H.

AU - Hokkyo, J.

AU - Osaka, T.

AU - Matsunuma, S.

AU - Sáfrán, G.

AU - Ariake, J.

AU - Ouchi, K.

PY - 2004/6/15

Y1 - 2004/6/15

N2 - The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N2 and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N2 gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.

AB - The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N2 and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N2 gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.

UR - http://www.scopus.com/inward/record.url?scp=3142717611&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=3142717611&partnerID=8YFLogxK

U2 - 10.1063/1.1736324

DO - 10.1063/1.1736324

M3 - Article

AN - SCOPUS:3142717611

SN - 0021-8979

VL - 95

SP - 8023

EP - 8029

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 12

ER -

Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this