Microstructure and magnetic properties of SmCo5 thin films deposited on Cu and Pt underlayers

Y. K. Takahashi; T. Ohkubo; K. Hono

doi:10.1063/1.2266247

Microstructure and magnetic properties of SmCo₅ thin films deposited on Cu and Pt underlayers

Y. K. Takahashi^*, T. Ohkubo, K. Hono

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

42 Citations (Scopus)

Abstract

The microstructure of the SmCo₅ thin films sputter deposited on Cu underlayers was investigated to explain the high coercivity H_c. Energy filtered elemental map and energy dispersive x-ray spectroscopy line analysis showed that Cu diffused into the SmCo₅ layer to form a Sm(Co,Cu)₅ solid solution. Composition fluctuations with a scale length of 40 nm were found within the Sm(Co,Cu)₅ layer, which would cause the local changes in the magnetocrystalline anisotropy. The high coercivity that was observed in the continuous Sm(Co,Cu)₅ layer may be attributed to the pinning force for the magnetic domain wall motion due to the fluctuation of the magnetocrystalline anisotropy. The structure and magnetic properties of the SmCo₅ thin film deposited on a Pt underlayer were also examined for comparison.

Original language	English
Article number	053913
Journal	Journal of Applied Physics
Volume	100
Issue number	5
DOIs	https://doi.org/10.1063/1.2266247
Publication status	Published - 2006
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.2266247

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title = "Microstructure and magnetic properties of SmCo5 thin films deposited on Cu and Pt underlayers",

abstract = "The microstructure of the SmCo5 thin films sputter deposited on Cu underlayers was investigated to explain the high coercivity Hc. Energy filtered elemental map and energy dispersive x-ray spectroscopy line analysis showed that Cu diffused into the SmCo5 layer to form a Sm(Co,Cu)5 solid solution. Composition fluctuations with a scale length of 40 nm were found within the Sm(Co,Cu)5 layer, which would cause the local changes in the magnetocrystalline anisotropy. The high coercivity that was observed in the continuous Sm(Co,Cu)5 layer may be attributed to the pinning force for the magnetic domain wall motion due to the fluctuation of the magnetocrystalline anisotropy. The structure and magnetic properties of the SmCo5 thin film deposited on a Pt underlayer were also examined for comparison.",

author = "Takahashi, {Y. K.} and T. Ohkubo and K. Hono",

note = "Funding Information: This work was in part supported by the Ministry of Education, Science, Sports and Culture of Japan, Grant-in-Aid for Scientific Research (B), 17360346, 2005.",

year = "2006",

doi = "10.1063/1.2266247",

language = "English",

volume = "100",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

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T1 - Microstructure and magnetic properties of SmCo5 thin films deposited on Cu and Pt underlayers

AU - Takahashi, Y. K.

AU - Ohkubo, T.

AU - Hono, K.

N1 - Funding Information: This work was in part supported by the Ministry of Education, Science, Sports and Culture of Japan, Grant-in-Aid for Scientific Research (B), 17360346, 2005.

PY - 2006

Y1 - 2006

N2 - The microstructure of the SmCo5 thin films sputter deposited on Cu underlayers was investigated to explain the high coercivity Hc. Energy filtered elemental map and energy dispersive x-ray spectroscopy line analysis showed that Cu diffused into the SmCo5 layer to form a Sm(Co,Cu)5 solid solution. Composition fluctuations with a scale length of 40 nm were found within the Sm(Co,Cu)5 layer, which would cause the local changes in the magnetocrystalline anisotropy. The high coercivity that was observed in the continuous Sm(Co,Cu)5 layer may be attributed to the pinning force for the magnetic domain wall motion due to the fluctuation of the magnetocrystalline anisotropy. The structure and magnetic properties of the SmCo5 thin film deposited on a Pt underlayer were also examined for comparison.

AB - The microstructure of the SmCo5 thin films sputter deposited on Cu underlayers was investigated to explain the high coercivity Hc. Energy filtered elemental map and energy dispersive x-ray spectroscopy line analysis showed that Cu diffused into the SmCo5 layer to form a Sm(Co,Cu)5 solid solution. Composition fluctuations with a scale length of 40 nm were found within the Sm(Co,Cu)5 layer, which would cause the local changes in the magnetocrystalline anisotropy. The high coercivity that was observed in the continuous Sm(Co,Cu)5 layer may be attributed to the pinning force for the magnetic domain wall motion due to the fluctuation of the magnetocrystalline anisotropy. The structure and magnetic properties of the SmCo5 thin film deposited on a Pt underlayer were also examined for comparison.

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Microstructure and magnetic properties of SmCo₅ thin films deposited on Cu and Pt underlayers

Abstract

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