Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation

Kyosuke Ito; Takashi Matsumoto; Shinichi Nishizawa; Hiroki Sunagawa; Kazutoshi Kobayashi; Hidetoshi Onodera

doi:10.1109/ISQED.2011.5770698

Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation

Kyosuke Ito^*, Takashi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

22 Citations (Scopus)

Abstract

This paper presents a new model for the statistical analysis of the impact of Random Telegraph Noise (RTN) on circuit delay. This RTN-aware delay model have been developed using Pseudo RTN based on a Markov process with RTN statistical property. We have also measured RTN-induced delay fluctuation using a circuit matrix array fabricated in a 65nm process. Measured results include frequency fluctuations that have power spectrum density of 1/f² property, which clearly indicates the effect of RTN-induced delay fluctuations. From the comparison of the maximum frequency shifts obtained by measurements and simulations, the V_gs-dependency of RTN-induced V_th attenuates the RTN impact on delay around by half.

Original language	English
Title of host publication	Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011
Pages	22-27
Number of pages	6
DOIs	https://doi.org/10.1109/ISQED.2011.5770698
Publication status	Published - 2011
Externally published	Yes
Event	12th International Symposium on Quality Electronic Design, ISQED 2011 - Santa Clara, CA, United States Duration: 2011 Mar 14 → 2011 Mar 16

Publication series

Name	Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011

Conference

Conference	12th International Symposium on Quality Electronic Design, ISQED 2011
Country/Territory	United States
City	Santa Clara, CA
Period	11/3/14 → 11/3/16

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/ISQED.2011.5770698

Cite this

Ito, K., Matsumoto, T., Nishizawa, S., Sunagawa, H., Kobayashi, K., & Onodera, H. (2011). Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011 (pp. 22-27). Article 5770698 (Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011). https://doi.org/10.1109/ISQED.2011.5770698

Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation. / Ito, Kyosuke; Matsumoto, Takashi; Nishizawa, Shinichi et al.
Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011. 2011. p. 22-27 5770698 (Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ito, K, Matsumoto, T, Nishizawa, S, Sunagawa, H, Kobayashi, K & Onodera, H 2011, Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation. in Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011., 5770698, Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, pp. 22-27, 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, CA, United States, 11/3/14. https://doi.org/10.1109/ISQED.2011.5770698

Ito K, Matsumoto T, Nishizawa S, Sunagawa H, Kobayashi K, Onodera H. Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011. 2011. p. 22-27. 5770698. (Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011). doi: 10.1109/ISQED.2011.5770698

Ito, Kyosuke ; Matsumoto, Takashi ; Nishizawa, Shinichi et al. / Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation. Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011. 2011. pp. 22-27 (Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011).

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abstract = "This paper presents a new model for the statistical analysis of the impact of Random Telegraph Noise (RTN) on circuit delay. This RTN-aware delay model have been developed using Pseudo RTN based on a Markov process with RTN statistical property. We have also measured RTN-induced delay fluctuation using a circuit matrix array fabricated in a 65nm process. Measured results include frequency fluctuations that have power spectrum density of 1/f2 property, which clearly indicates the effect of RTN-induced delay fluctuations. From the comparison of the maximum frequency shifts obtained by measurements and simulations, the Vgs-dependency of RTN-induced Vth attenuates the RTN impact on delay around by half.",

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Modeling of Random Telegraph Noise under circuit operation Simulation and measurement of RTN-induced delay fluctuation

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