TY - GEN
T1 - Modelling and evaluation of recovery control for degradable/recoverable information systems
AU - Murata, Tomohiro
PY - 2006/12/1
Y1 - 2006/12/1
N2 - This paper proposes an effective design method of degradable/recoverable information system by using two methods of Sate Diagram Matrix (SDM), which is a structural state based description formalism, and Total High Performance Time (THPT) which is a performance-related system reliability measure. SDM is useful to identify pending states for restoring system state from a degraded state to a normal state. Control method of recovery procedure in the pending states is detailed by using Extended Stochastic Petri Net (ESPN) to evaluate THPT. We illustrate effectiveness of combining these methods for degradable/recoverable information system behavioural specification and performance-related reliability evaluation through an application of storage system with mirrored disks.
AB - This paper proposes an effective design method of degradable/recoverable information system by using two methods of Sate Diagram Matrix (SDM), which is a structural state based description formalism, and Total High Performance Time (THPT) which is a performance-related system reliability measure. SDM is useful to identify pending states for restoring system state from a degraded state to a normal state. Control method of recovery procedure in the pending states is detailed by using Extended Stochastic Petri Net (ESPN) to evaluate THPT. We illustrate effectiveness of combining these methods for degradable/recoverable information system behavioural specification and performance-related reliability evaluation through an application of storage system with mirrored disks.
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U2 - 10.1109/ICIEA.2006.257088
DO - 10.1109/ICIEA.2006.257088
M3 - Conference contribution
AN - SCOPUS:37649030598
SN - 078039514X
SN - 9780780395145
T3 - 2006 1st IEEE Conference on Industrial Electronics and Applications
BT - 2006 1st IEEE Conference on Industrial Electronics and Applications
T2 - 2006 1st IEEE Conference on Industrial Electronics and Applications, ICIEA 2006
Y2 - 24 May 2006 through 26 May 2006
ER -