Abstract
We perform a series of molecular dynamics (MD) simulations to investigate the heat transport in Si nano-structures, while explicitly including oxide cover layers in the simulation system for the first time. The dependences of thermal diffusion velocity on the thicknesses of the SiO2 film and Si lattice are investigated. The results show that thermal diffusion velocity decreases with Si lattice thickness and does not depend on SiO2 film thickness.
Original language | English |
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Article number | 04DN08 |
Journal | Japanese journal of applied physics |
Volume | 49 |
Issue number | 4 PART 2 |
DOIs | |
Publication status | Published - 2010 Apr |
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)