TY - GEN
T1 - Multi-spectral analytical systems using libs and LII techniques
AU - Ikezawa, Satoshi
AU - Wakamatsu, Muneaki
AU - Zimin, Yury L Vovich
AU - Pawlat, Joanna
AU - Ueda, Toshitsugu
PY - 2011
Y1 - 2011
N2 - In this paper, we propose an advanced approach to particle analysis, involving laser-induced breakdown spectroscopy (LIBS) and laser-induced incandescence (LII) temporal analytical techniques. Various technical properties of fine particles are analyzed via LIBS and LII. LIBS is a useful tool for determining the elemental composition and relative concentration of various materials, whereas LII facilitates the measurement of particle size. Both techniques do not require any pre-processing. The combined use of the LIBS and LII techniques enables highly synergistic fine particle measurement. In the LIBS section, we propose spectrometric analysis via a novel ink-jet technique, and we discuss the effectiveness of Ar as a surrounding gas. In the LII section, we compare the calculated particle size prediction with the experimental results.
AB - In this paper, we propose an advanced approach to particle analysis, involving laser-induced breakdown spectroscopy (LIBS) and laser-induced incandescence (LII) temporal analytical techniques. Various technical properties of fine particles are analyzed via LIBS and LII. LIBS is a useful tool for determining the elemental composition and relative concentration of various materials, whereas LII facilitates the measurement of particle size. Both techniques do not require any pre-processing. The combined use of the LIBS and LII techniques enables highly synergistic fine particle measurement. In the LIBS section, we propose spectrometric analysis via a novel ink-jet technique, and we discuss the effectiveness of Ar as a surrounding gas. In the LII section, we compare the calculated particle size prediction with the experimental results.
KW - LIBS
KW - LII
KW - particle measurement
KW - real-time measurement
UR - http://www.scopus.com/inward/record.url?scp=79551579149&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79551579149&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-17943-3_11
DO - 10.1007/978-3-642-17943-3_11
M3 - Conference contribution
AN - SCOPUS:79551579149
SN - 9783642179426
VL - 83 LNEE
T3 - Lecture Notes in Electrical Engineering
SP - 207
EP - 232
BT - Lecture Notes in Electrical Engineering
T2 - 4th International Conference on Sensing Technology, ICST 2010
Y2 - 3 June 2010 through 5 June 2010
ER -