Nano-Artifact Metrics Chip Mounting Technology for Edge AI Device Security

Hitoshi Masago, Hiro Nodaka, Kazuma Kishimoto, Alaric Yohei Kawai, Shuichi Shoji, Jun Mizuno

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this study, the effect of surface treatment on the boding strength between Quad flat package (QFP) and quartz was investigated for establishing a QFP/quartz glass bonding technique. This bonding technique is necessary to prevent bond failure at the nano-artifact metrics (NAM) chip and adhesive interface against physical attacks such as counterfeiting and tampering of edge AI devices that use NAM chips. Therefore, we investigated the relationship between surface roughness and tensile strength by applying surface treatments such as vacuum ultraviolet (VUV) and Ar/O2 plasma. All QFP/quartz glass with surface treatments such as VUV and Ar/O2 plasma showed increased bond strength. Surface treatment and bonding technology for QFP and quartz glass were established to realize NAM chip mounting.

Original languageEnglish
Title of host publicationProceedings - 2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2022
PublisherIEEE Computer Society
ISBN (Electronic)9781665452212
DOIs
Publication statusPublished - 2022
Event17th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2022 - Taipei, Taiwan, Province of China
Duration: 2022 Oct 262022 Oct 28

Publication series

NameProceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT
Volume2022-October
ISSN (Print)2150-5934
ISSN (Electronic)2150-5942

Conference

Conference17th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2022
Country/TerritoryTaiwan, Province of China
CityTaipei
Period22/10/2622/10/28

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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