Nanofabrication of sulfonated polystyrene-g-FEP with silver ion (Ag+) using ion beam direct etching and reduction

Hidehiro Tsubokura*, Akihiro Oshima, Tomoko Gowa Oyama, Hiroki Yamamoto, Takeshi Murakami, Seiichi Tagawa, Masakazu Washio

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Functionalized poly(tetrafluoroethylene-co-hexafluoropropylene (FEP)) was fabricated by electron beam (EB) induced grafting technique and chemical sulfonation treatment. The functionalized FEP (s-FEP) films were immersed in the silver nitrate (AgNO3) solution under ambient condition, to exchange on ionic sites from proton ion-form to Ag+ ion-form, and then the Ag-formed s-FEP polymers were obtained. Ag-formed s-FEP was irradiated with 30 keV Ga+ focused ion beam (FIB) and 6 MeV/u dispersed Ne10+ ion beam (DIB). The irradiated areas were evaluated by a scanning electron microscopy (SEM) with an energy dispersive X-ray spectroscopy (EDX). In both cases of FIB and DIB irradiations, the nano-scale particles were appeared on the surface of irradiated areas. From the results of EDX analysis for the particles, the peaks which were assigned to silver atoms were clearly detected, and peak intensities were higher than un-irradiated one. It is suggested that the Ag+ ions would be reduced by ion beam irradiation and appeared as silver nano-scale particles with pure silver metal and its oxidative chemical compounds.

Original languageEnglish
Pages (from-to)513-516
Number of pages4
JournalJournal of Photopolymer Science and Technology
Volume24
Issue number5
DOIs
Publication statusPublished - 2011

Keywords

  • Metal reduction
  • Nano-particles
  • Polystyrene-g-FEP
  • SEM-EDX
  • Ton beam

ASJC Scopus subject areas

  • Polymers and Plastics
  • Organic Chemistry
  • Materials Chemistry

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