TY - GEN
T1 - Nanosecond high-voltage pulse generator using a spiral blumlein for electromagnetic interference test
AU - Lim, S. W.
AU - Kim, J. S.
AU - Cho, C. H.
AU - Kim, Y. B.
AU - Katsuki, S.
AU - Jin, Y. S.
PY - 2013
Y1 - 2013
N2 - Electromagnetic pulses (EMP) can be delivered to electronic equipment in two ways: Through the application of radiated fields, and through conduction along cables and wires. In this study, a high-voltage pulse generator using a spiral Blumlein Pulse Forming Line (PFL) was developed to test EMP effects by radiation and conduction. For the conduction test, a spiral strip Blumlein PFL with transformer oil was employed to generate high voltage (>300kV) and long duration (50∼ ns) pulses. High power ultrawide band pulses for the radiation test were generated by combining a TEM horn antenna with the high voltage generator. The peak-to-peak value of electric field intensity of a radiated pulse was approximately 53kV/m at a distance of 10m away from the antenna. The pulse generation system will be used for the examination of effects of the electric fields and conducted pulses on the operation of electronic devices.
AB - Electromagnetic pulses (EMP) can be delivered to electronic equipment in two ways: Through the application of radiated fields, and through conduction along cables and wires. In this study, a high-voltage pulse generator using a spiral Blumlein Pulse Forming Line (PFL) was developed to test EMP effects by radiation and conduction. For the conduction test, a spiral strip Blumlein PFL with transformer oil was employed to generate high voltage (>300kV) and long duration (50∼ ns) pulses. High power ultrawide band pulses for the radiation test were generated by combining a TEM horn antenna with the high voltage generator. The peak-to-peak value of electric field intensity of a radiated pulse was approximately 53kV/m at a distance of 10m away from the antenna. The pulse generation system will be used for the examination of effects of the electric fields and conducted pulses on the operation of electronic devices.
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U2 - 10.1109/PPC.2013.6627432
DO - 10.1109/PPC.2013.6627432
M3 - Conference contribution
AN - SCOPUS:84888622789
SN - 9781467351676
T3 - Digest of Technical Papers-IEEE International Pulsed Power Conference
BT - 2013 19th IEEE Pulsed Power Conference, PPC 2013
T2 - 2013 19th IEEE Pulsed Power Conference, PPC 2013
Y2 - 16 June 2013 through 21 June 2013
ER -