Non-destructive diagnosis of degradation of silicone rubber by indenter modulus and scanning probe microscopy

Shugo Hanada, Daisuke Odaka, Liuqing Yang, Naoshi Hirai, Yoshimichi Ohki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

We aged silicone rubber, which is widely used for electrical insulation of cables in nuclear power plants under various conditions. The surface of each sample was measured by an indenter and a scanning probe microscope (SPM) for non-destructive diagnosis. As a result, it has become clear that the surface of silicone rubber becomes hard with the progress of degradation in both cases of thermal aging and simultaneous aging by heat and radiation. The indenter modulus shows a good correlation with the elongation at break (EAB). On the other hand, the delay of phase angle measured by SPM exhibits a rather low correlation with EAB. Through the results of thermal analyses, it seems that the thermal aging without radiation induces cross-linking first, which is followed by bond break. However, bond breakage seems predominant over cross-linking in the simultaneous aging with heat and radiation.

Original languageEnglish
Title of host publicationCMD 2016 - International Conference on Condition Monitoring and Diagnosis
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages123-126
Number of pages4
ISBN (Electronic)9781509033980
DOIs
Publication statusPublished - 2016 Nov 28
Event2016 International Conference on Condition Monitoring and Diagnosis, CMD 2016 - Xi'an, China
Duration: 2016 Sept 252016 Sept 28

Other

Other2016 International Conference on Condition Monitoring and Diagnosis, CMD 2016
Country/TerritoryChina
CityXi'an
Period16/9/2516/9/28

Keywords

  • Diagnosis
  • elongation at break
  • indenter modulus
  • nuclear power plant
  • scanning probe microscopy
  • silicone rubber

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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