Numerical simulation of critical current performance in nb3sn strand subjected to periodic bending deformation

Haruyuki Murakami*, Hiroshi Ueda, Atsushi Ishiyama, Norikiyo Koizumi, Kiyoshi Okuno

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In the ITER Engineering Design Activity (EDA), four NB3Sn model coils were developed and successfully tested. However, it was revealed that the critical current of the conductor degraded with the increase of electromagnetic force. One of the explanations of this phenomenon is a strand bending caused by enormous electromagnetic force. The authors therefore developed a simulation code using the distributed circuit model to investigate dependency of the critical current performance on the periodic bending deformation. The simulation results were in good agreement with the experiments. The dependence of the critical current on the periodic transverse load, temperature, periodic load pitch, thickness of Ta barrier which prevents Cu stabilizer from being contaminated by Sn, twist pitch of the strand, and RRR of the bronze matrix was investigated using the developed code. The results showed that the critical current degraded less with decreasing the pitch of the transverse load and increasing the Ta barrier thickness. It suggests that the shorter cabling pitch and the larger bending stiffness prevent the critical current degradation.

Original languageEnglish
Pages (from-to)7-15
Number of pages9
JournalElectrical Engineering in Japan (English translation of Denki Gakkai Ronbunshi)
Volume171
Issue number3
DOIs
Publication statusPublished - 2010 May

Keywords

  • Bending strain
  • CIC conductor
  • Critical current
  • Degradation

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Numerical simulation of critical current performance in nb3sn strand subjected to periodic bending deformation'. Together they form a unique fingerprint.

Cite this