Observing diamond defects with an analytical color fluorescence electron microscope

Kazuhito Nishimura; Tohru Nakano; Hirotami Koike; Hiroshi Tomimori; Hiroshi Kawarada; Akio Hiraki; Kazuo Ogawa

Observing diamond defects with an analytical color fluorescence electron microscope

Kazuhito Nishimura^*, Tohru Nakano, Hirotami Koike, Hiroshi Tomimori, Hiroshi Kawarada, Akio Hiraki, Kazuo Ogawa

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

We have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400-700nm) to distinguish the type, size, and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds, and is far superior to X-PS and SIMS as a tool for analyzing dopants.

Original language	English
Pages (from-to)	267-282
Number of pages	16
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1325
Publication status	Published - 1990
Externally published	Yes
Event	Diamond Optics III - San Diego, CA, USA Duration: 1990 Jul 9 → 1990 Jul 11

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

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title = "Observing diamond defects with an analytical color fluorescence electron microscope",

abstract = "We have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400-700nm) to distinguish the type, size, and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds, and is far superior to X-PS and SIMS as a tool for analyzing dopants.",

author = "Kazuhito Nishimura and Tohru Nakano and Hirotami Koike and Hiroshi Tomimori and Hiroshi Kawarada and Akio Hiraki and Kazuo Ogawa",

year = "1990",

language = "English",

volume = "1325",

pages = "267--282",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Diamond Optics III ; Conference date: 09-07-1990 Through 11-07-1990",

}

TY - JOUR

T1 - Observing diamond defects with an analytical color fluorescence electron microscope

AU - Nishimura, Kazuhito

AU - Nakano, Tohru

AU - Koike, Hirotami

AU - Tomimori, Hiroshi

AU - Kawarada, Hiroshi

AU - Hiraki, Akio

AU - Ogawa, Kazuo

PY - 1990

Y1 - 1990

N2 - We have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400-700nm) to distinguish the type, size, and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds, and is far superior to X-PS and SIMS as a tool for analyzing dopants.

AB - We have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400-700nm) to distinguish the type, size, and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds, and is far superior to X-PS and SIMS as a tool for analyzing dopants.

UR - http://www.scopus.com/inward/record.url?scp=0025535325&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025535325&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0025535325

SN - 0277-786X

VL - 1325

SP - 267

EP - 282

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Diamond Optics III

Y2 - 9 July 1990 through 11 July 1990

ER -

Observing diamond defects with an analytical color fluorescence electron microscope

Abstract

ASJC Scopus subject areas

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