TY - JOUR
T1 - Optimized mounting of a polyethylene naphthalate scintillation material in a radiation detector
AU - Nakamura, Hidehito
AU - Yamada, Tatsuya
AU - Shirakawa, Yoshiyuki
AU - Kitamura, Hisashi
AU - Shidara, Zenichiro
AU - Yokozuka, Takayuki
AU - Nguyen, Philip
AU - Kanayama, Masaya
AU - Takahashi, Sentaro
N1 - Funding Information:
This research was supported by the Kyoto University, National Institute of Radiological Sciences, Teijin Ltd . The authors thank the KUR Research Program for the Scientific Basis of Nuclear Safety for partial support at this work. The authors are grateful to Dr. Y. Uchihori, Dr. H. Yamana, Mr. T. Watanabe, Mr. Y. Okamaoto, Mr. F. Murakawa and Ms. M. Yasaku for their co-operation.
Copyright:
Copyright 2013 Elsevier B.V., All rights reserved.
PY - 2013/10
Y1 - 2013/10
N2 - Polyethylene naphthalate (PEN) has great potential as a scintillation material for radiation detection. Here the optimum mounting conditions to maximize the light collection efficiency from PEN in a radiation detector are discussed. To this end, we have determined light yields emitted from irradiated PEN for various optical couplings between the substrate and the photodetector, and for various substrate surface treatments. The results demonstrate that light extraction from PEN is more sensitive to the optical couplings due to its high refractive index. We also assessed the extent of radioactive impurities in PEN as background sources and found that the impurities are equivalent to the environmental background level.
AB - Polyethylene naphthalate (PEN) has great potential as a scintillation material for radiation detection. Here the optimum mounting conditions to maximize the light collection efficiency from PEN in a radiation detector are discussed. To this end, we have determined light yields emitted from irradiated PEN for various optical couplings between the substrate and the photodetector, and for various substrate surface treatments. The results demonstrate that light extraction from PEN is more sensitive to the optical couplings due to its high refractive index. We also assessed the extent of radioactive impurities in PEN as background sources and found that the impurities are equivalent to the environmental background level.
KW - Light yield
KW - Mounting condition
KW - Polyethylene naphthalate
KW - Radioactive impurity
KW - Refractive index
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U2 - 10.1016/j.apradiso.2013.06.011
DO - 10.1016/j.apradiso.2013.06.011
M3 - Article
C2 - 23845742
AN - SCOPUS:84880371121
SN - 0969-8043
VL - 80
SP - 84
EP - 87
JO - Applied Radiation and Isotopes
JF - Applied Radiation and Isotopes
ER -