Optimum waveguide-core size for reducing device property distribution of Si-wire waveguide devices

Munetoshi Soma, Tomohiro Kita*, Yuichiro Tanushi, Munehiro Toyama, Miyoshi Seki, Nobuyuki Yokoyama, Minoru Ohtsuka, Hirohito Yamada

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)


We investigated the waveguide-core size distribution of ring resonators fabricated on a 300mm silicon-on-insulator (SOI) wafer using a CMOScompatible process featuring ArF immersion lithography. These ring resonators were constructed in a Si-wire waveguide with a standard core size of 400nm width and 220nm height. The group refractive indices of the waveguide were derived from the transmission spectra of the ring resonators. From the deviation of these group refractive indices, the waveguide-core width distribution was estimated to be 5 nm, and the waveguide-core height distribution was estimated to be 1 nm. Moreover, the device property distribution of various Si-wire waveguide depended on the estimated fabrication error was calculated. The waveguide core with the smallest device property distribution had a 540nm width and a 160nm height, and this waveguide has a device property distribution of 2/3 value compared with the standard core size.

Original languageEnglish
Article number04DG03
JournalJapanese journal of applied physics
Issue number4
Publication statusPublished - 2015 Apr 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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