Parallel Architecture for Generalized LFSR in LSI Built-in Self Testing

Tomoko K. Matsushima*, Toshiyasu Matsushima, Shigeichi Hirasawa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


This paper presents a new architecture for multiple-input signature analyzers. The proposed signature analyzer with H5 inputs is designed by parallelizing a GLFSR(6, m), where 6 is the number of input signals and m is the number of stages in the feedback shift register. The GLFSR, developed by Pradhan and Gupta, is a general framework for representing LFSRbased signature analyzers. The parallelization technique described in this paper can be applied to any kind of GLFSR signature analyzer, e.g., SISRs, MISRs, multiple MISRs and MLFSRs. It is shown that a proposed signature analyzer with H6 inputs requires less complex hardware than either single GLFSR(H5, m)s or a parallel construction of the H original GLFSR(c5, m)s. It is also shown that the proposed signature analyzer, while requiring simpler hardware, has comparable aliasing probability with analyzers using conventional GLFSRs for some CUT error models of the same test response length and test time. The proposed technique would be practical for testing CUTs with a large number of output sequences, since the test circuit occupies a smaller area on the LSI chip than the conventional multiple-input signature analyzers of comparable aliasing probability.

Original languageEnglish
Pages (from-to)1252-1261
Number of pages10
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Issue number6
Publication statusPublished - 1998 Jan 1


  • Aliasing probability
  • Built-in self test
  • Linear feedback shift register
  • Parallel architecture
  • Signature analysis

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics


Dive into the research topics of 'Parallel Architecture for Generalized LFSR in LSI Built-in Self Testing'. Together they form a unique fingerprint.

Cite this