Abstract
A simple parametrization of energy straggling of 2-200 MeV/nucleon heavy ions traversing thick silicon detectors, based on the Tschalär-Payne theory, is presented. With this parametrization, analytical expressions for the charge and mass resolution of energetic ions detected on ΔE - E telescopes can be obtained. Several consequences that can be extracted from these expressions are analysed, especially, in what concerns the thickness selection for multi-detector telescopes. The validity of those analytical formulae are tested with experimental resolutions obtained from calibration data of three different cosmic-ray telescopes.
Original language | English |
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Pages (from-to) | 65-75 |
Number of pages | 11 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 399 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1997 Nov 1 |
Externally published | Yes |
Keywords
- Charge resolution
- Mass resolution
- Particle identification
- Silicon detector telescopes
ASJC Scopus subject areas
- Instrumentation
- Nuclear and High Energy Physics