Perpendicular magnetic anisotropy of Co2FexMn1-xSi Heusler alloy ultra-thin films

Tomonari Kamada, Takahide Kubota*, Shigeki Takahashi, Yoshiaki Sonobe, Koki Takanashi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)


Film thickness, composition, and buffer layer dependences of perpendicular magnetic anisotropy (PMA) were investigated for ultrathin Co2FexMn1-xSi Heusler alloy films. The perpendicular magnetization was achieved when the thickness of the Co2MnSi on the Pd buffer layer was 0.6 and 0.8 nm. For Co2FeSi, only a 0.6 nm thick film exhibited perpendicular magnetization. Effective uniaxial magnetic anisotropy energy (K \(-{\rm u}^{\rm eff}\) ) was 1- \(2\,\times \, 10^{6}\) erg/cm \(^{3}\). From the buffer layer dependence, it was revealed that perpendicular magnetization of Co2FeSi films was not achieved for a MgO or Cr buffer layer. These results imply that contributions from the Pd/Heusler alloy interface plays an important role in the PMA of ultrathin Co2FexMn1-xSi Heusler alloy films.

Original languageEnglish
Article number6971376
JournalIEEE Transactions on Magnetics
Issue number11
Publication statusPublished - 2014 Nov 1
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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