TY - GEN
T1 - Phase-adjustable Error Detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for Dynamic Voltage Scaling
AU - Kurimoto, Masanori
AU - Suzuki, Hiroaki
AU - Akiyama, Rei
AU - Yamanaka, Tadao
AU - Ohkuma, Haruyuki
AU - Takata, Hidehiro
AU - Shinohara, Hirofumi
PY - 2008/9/17
Y1 - 2008/9/17
N2 - Error Detection FFs for Dynamic Voltage Scaling (DVS) has been proposed. This technique controls the clock phase based on the timing slack, and reduces the energy consumption by 19.8% compared to non-DVS. The error signal latency is shortened to 6.3%, the area and power penalties for delay buffers on short paths become 35.0% and 40.6% lower compared to the conventional DVS.
AB - Error Detection FFs for Dynamic Voltage Scaling (DVS) has been proposed. This technique controls the clock phase based on the timing slack, and reduces the energy consumption by 19.8% compared to non-DVS. The error signal latency is shortened to 6.3%, the area and power penalties for delay buffers on short paths become 35.0% and 40.6% lower compared to the conventional DVS.
KW - CTS
KW - DVS
KW - Error-Detection flip-flop
KW - STA
UR - http://www.scopus.com/inward/record.url?scp=51549088217&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51549088217&partnerID=8YFLogxK
U2 - 10.1109/DAC.2008.4555944
DO - 10.1109/DAC.2008.4555944
M3 - Conference contribution
AN - SCOPUS:51549088217
SN - 9781605581156
T3 - Proceedings - Design Automation Conference
SP - 884
EP - 889
BT - Proceedings of the 45th Design Automation Conference, DAC
T2 - 45th Design Automation Conference, DAC
Y2 - 8 June 2008 through 13 June 2008
ER -