Phase retrieval microscope based on photon image detection

Yusuke Nakashima*, Masayuki Hattori, Shinichi Komatsu

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)


    The accuracy and sensitivity of the phase retrieval from a Fraunhofer diffraction pattern greatly depend on the dynamic range of the measured Fraunhofer diffraction pattern. In this study, a photon-imaging detector was adopted to detect higher order diffraction spots of a very weak phase grating. The phase retrieval was accomplished fairly well experimentally from the Fraunhofer diffraction intensity distribution data including up to the third-order diffraction spots to which the iterative Fourier transform algorithms were applied. The object phase distribution was retrieved with satisfactory accuracy and sensitivity. A newly introduced procedure for measuring the entire diffraction pattern with single photon-imaging detector is also described.

    Original languageEnglish
    Pages (from-to)4809-4812
    Number of pages4
    JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    Issue number7 B
    Publication statusPublished - 2002 Jul


    • Fraunhofer diffractio
    • Iterative Fourier transform algorithm
    • Phase retrieval

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)


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