Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

Mamoru Iwabuchi; Tatsuhiko Fujii; Takeshi Kobayashi

doi:10.1143/JJAP.32.L491

Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

Mamoru Iwabuchi, Tatsuhiko Fujii, Takeshi Kobayashi

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.

Original language	English
Pages (from-to)	491-494
Number of pages	4
Journal	Japanese journal of applied physics
Volume	32
Issue number	4 A
DOIs	https://doi.org/10.1143/JJAP.32.L491
Publication status	Published - 1993 Apr
Externally published	Yes

Keywords

Built-in band bending
Diffusion length of YBa2Cu30K minority carriers
EBIC
Photoinduced short-circuit current
YBa2Cu30K MIS structure

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.32.L491

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title = "Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State",

abstract = "We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.",

keywords = "Built-in band bending, Diffusion length of YBa2Cu30K minority carriers, EBIC, Photoinduced short-circuit current, YBa2Cu30K MIS structure",

author = "Mamoru Iwabuchi and Tatsuhiko Fujii and Takeshi Kobayashi",

year = "1993",

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doi = "10.1143/JJAP.32.L491",

language = "English",

volume = "32",

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journal = "Japanese journal of applied physics",

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publisher = "Japan Society of Applied Physics",

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T1 - Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

AU - Iwabuchi, Mamoru

AU - Fujii, Tatsuhiko

AU - Kobayashi, Takeshi

PY - 1993/4

Y1 - 1993/4

N2 - We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.

AB - We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.

KW - Built-in band bending

KW - Diffusion length of YBa2Cu30K minority carriers

KW - EBIC

KW - Photoinduced short-circuit current

KW - YBa2Cu30K MIS structure

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DO - 10.1143/JJAP.32.L491

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SN - 0021-4922

VL - 32

SP - 491

EP - 494

JO - Japanese journal of applied physics

JF - Japanese journal of applied physics

IS - 4 A

ER -

Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

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