PIXE and PIXE-induced XRF for chemical specification

M. Uda*, T. Yamamoto

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

9 Citations (Scopus)


Wavelength dispersive X-ray spectra with fine structures in the PIXE and PIXE-induced XRF spectra have been proved to be very much useful for chemical specification of condensed matters. The fine structures have been reproduced theoretically by introducing molecular orbital calculations, the shake-off and resonant orbital rearrangement (ROR) processes, together with the direct Coulomb interaction between projectiles and target atoms, and the self-absorption of emitted X-rays through the targets. Comparison between observed and theoretical spectra is given here for F and S atoms.

Original languageEnglish
Pages (from-to)1-7
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number1-4
Publication statusPublished - 1999 Apr 2
EventProceedings of the 1998 8th International Conference on PIXE and its Analytical Applications - Lund, Swed
Duration: 1998 Jun 141998 Jun 18

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation


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