Polarimetric performance of Si/CdTe semiconductor Compton camera

Shin'Ichiro Takeda*, Hirokazu Odaka, Junichiro Katsuta, Shin Nosuke Ishikawa, So Ichiro Sugimoto, Yuu Koseki, Shin Watanabe, Goro Sato, Motohide Kokubun, Tadayuki Takahashi, Kazuhiro Nakazawa, Yasushi Fukazawa, Hiroyasu Tajima, Hidenori Toyokawa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and γray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized γrays at SPring-8.

Original languageEnglish
Pages (from-to)619-627
Number of pages9
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue number3
Publication statusPublished - 2010 Oct 21


  • Compton camera
  • Gamma-ray astronomy
  • Polarimeter

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics


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