Pulse duration dependence of ablation threshold for fused silica in the visible femtosecond regime

E. Terasawa; T. Shibuya; D. Satoh; Y. Moriai; H. Ogawa; M. Tanaka; R. Kuroda; Y. Kobayashi; K. Sakaue; M. Washio

doi:10.1007/s00339-020-03640-0

Pulse duration dependence of ablation threshold for fused silica in the visible femtosecond regime

E. Terasawa^*, T. Shibuya, D. Satoh, Y. Moriai, H. Ogawa, M. Tanaka, R. Kuroda, Y. Kobayashi, K. Sakaue, M. Washio

^*Corresponding author for this work

School of Advanced Science and Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

In this study, we investigated the variation of the femtosecond pulse duration of the threshold fluence of fused silica by a single-shot irradiation at a wavelength of 400 nm. The single-shot threshold fluence was obtained from the relationship between the crater area based on the crater shape and the irradiation fluence. The crater shape was divided into two affected regimes depending on the pulse duration and the laser fluence. The crater depth and each threshold fluence for the corresponding two affected regimes were also measured. We have found that shorter pulse duration provides more energy-efficient results.

Original language	English
Article number	446
Journal	Applied Physics A: Materials Science and Processing
Volume	126
Issue number	6
DOIs	https://doi.org/10.1007/s00339-020-03640-0
Publication status	Published - 2020 Jun 1

Keywords

Ablation threshold
Femtosecond laser
Fused silica
Laser ablation
Pulse duration dependence
Visible wavelength

ASJC Scopus subject areas

Chemistry(all)
Materials Science(all)

Access to Document

10.1007/s00339-020-03640-0

Cite this

@article{57dfee682b5c4eea9bda166bf3ebd13e,

title = "Pulse duration dependence of ablation threshold for fused silica in the visible femtosecond regime",

abstract = "In this study, we investigated the variation of the femtosecond pulse duration of the threshold fluence of fused silica by a single-shot irradiation at a wavelength of 400 nm. The single-shot threshold fluence was obtained from the relationship between the crater area based on the crater shape and the irradiation fluence. The crater shape was divided into two affected regimes depending on the pulse duration and the laser fluence. The crater depth and each threshold fluence for the corresponding two affected regimes were also measured. We have found that shorter pulse duration provides more energy-efficient results.",

keywords = "Ablation threshold, Femtosecond laser, Fused silica, Laser ablation, Pulse duration dependence, Visible wavelength",

author = "E. Terasawa and T. Shibuya and D. Satoh and Y. Moriai and H. Ogawa and M. Tanaka and R. Kuroda and Y. Kobayashi and K. Sakaue and M. Washio",

note = "Funding Information: This work is partly based on the results obtained from the New Energy and Industrial Technology Development Organization (NEDO) Project (Grant No. P16011) {\textquoteleft}Development of advanced laser processing with intelligence based on high-brightness and high-efficiency laser technologies{\textquoteright} (TACMI Project). Publisher Copyright: {\textcopyright} 2020, Springer-Verlag GmbH Germany, part of Springer Nature.",

year = "2020",

month = jun,

day = "1",

doi = "10.1007/s00339-020-03640-0",

language = "English",

volume = "126",

journal = "Applied Physics A: Materials Science and Processing",

issn = "0947-8396",

number = "6",

}

TY - JOUR

T1 - Pulse duration dependence of ablation threshold for fused silica in the visible femtosecond regime

AU - Terasawa, E.

AU - Shibuya, T.

AU - Satoh, D.

AU - Moriai, Y.

AU - Ogawa, H.

AU - Tanaka, M.

AU - Kuroda, R.

AU - Kobayashi, Y.

AU - Sakaue, K.

AU - Washio, M.

N1 - Funding Information: This work is partly based on the results obtained from the New Energy and Industrial Technology Development Organization (NEDO) Project (Grant No. P16011) ‘Development of advanced laser processing with intelligence based on high-brightness and high-efficiency laser technologies’ (TACMI Project). Publisher Copyright: © 2020, Springer-Verlag GmbH Germany, part of Springer Nature.

PY - 2020/6/1

Y1 - 2020/6/1

N2 - In this study, we investigated the variation of the femtosecond pulse duration of the threshold fluence of fused silica by a single-shot irradiation at a wavelength of 400 nm. The single-shot threshold fluence was obtained from the relationship between the crater area based on the crater shape and the irradiation fluence. The crater shape was divided into two affected regimes depending on the pulse duration and the laser fluence. The crater depth and each threshold fluence for the corresponding two affected regimes were also measured. We have found that shorter pulse duration provides more energy-efficient results.

AB - In this study, we investigated the variation of the femtosecond pulse duration of the threshold fluence of fused silica by a single-shot irradiation at a wavelength of 400 nm. The single-shot threshold fluence was obtained from the relationship between the crater area based on the crater shape and the irradiation fluence. The crater shape was divided into two affected regimes depending on the pulse duration and the laser fluence. The crater depth and each threshold fluence for the corresponding two affected regimes were also measured. We have found that shorter pulse duration provides more energy-efficient results.

KW - Ablation threshold

KW - Femtosecond laser

KW - Fused silica

KW - Laser ablation

KW - Pulse duration dependence

KW - Visible wavelength

UR - http://www.scopus.com/inward/record.url?scp=85085261289&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85085261289&partnerID=8YFLogxK

U2 - 10.1007/s00339-020-03640-0

DO - 10.1007/s00339-020-03640-0

M3 - Article

AN - SCOPUS:85085261289

SN - 0947-8396

VL - 126

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 6

M1 - 446

ER -

Pulse duration dependence of ablation threshold for fused silica in the visible femtosecond regime

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this