Radiation and polarization properties of free-exciton emission from AlN (0001) surface

Yoshitaka Taniyasu*, Makoto Kasu, Toshiki Makimoto

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

58 Citations (Scopus)


Free-exciton emission from AlN (0001) surface was characterized by angle-dependent photoluminescence (PL) measurement. As the radiation direction was inclined from the surface normal (c -axis direction), the emission intensity increased. This is because the optical transition between the conduction band and the top valence band is mainly allowed for light with the electric field parallel to the c -axis direction of AlN (E∥c) and consequently the free-exciton emission is strongly polarized for E∥c. By analyzing the angle-dependent PL intensities, the polarization ratio was estimated to be 0.995. This high polarization ratio results from the large negative crystal-field splitting energy.

Original languageEnglish
Article number261911
JournalApplied Physics Letters
Issue number26
Publication statusPublished - 2007
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


Dive into the research topics of 'Radiation and polarization properties of free-exciton emission from AlN (0001) surface'. Together they form a unique fingerprint.

Cite this