Abstract
The polarized optical reflectance and photoreflectance spectra of an out-plane nonpolar ZnO epilayer grown by laser molecular-beam epitaxy was studied. The electric field component of its excitonic photoluminescence peak was polarized perpendicular to the [0001] axis. The monoenergetic positron beam line was used to determine the parameters in the ZnO epilayers. The negligible impact of growth direction on the defect incorporation suggests a potential use of epitaxial ZnO as polarization-sensitive optoelectronic devices operating in ultraviolet spectral regions.
Original language | English |
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Pages (from-to) | 1079-1081 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2004 Feb 16 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)