Abstract
The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.
| Original language | English |
|---|---|
| Pages (from-to) | 375-381 |
| Number of pages | 7 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 235 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 2001 Oct |
| Externally published | Yes |
| Event | Proceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan Duration: 2000 Oct 23 → 2000 Oct 26 |
Keywords
- Co-Ni-Fe head
- Focused-ion-beam
- Perpendicular magnetic recording
- Pole thickness
- Recording head
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics