Robust secure scan design against scan-based differential cryptanalysis

Youhua Shi*, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)


Scan technology carries the potential risk of being misused as a side channel to leak out the secrets of crypto cores. The existing scan-based attacks could be viewed as one kind of differential cryptanalysis, which takes advantages of scan chains to observe the bit changes between pairs of chosen plaintexts so as to identify the secret keys. To address such a design/test challenge, this paper proposes a robust secure scan structure design for crypto cores as a countermeasure against scan-based attacks to maintain high security without compromising the testability.

Original languageEnglish
Article number5734887
Pages (from-to)176-181
Number of pages6
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number1
Publication statusPublished - 2012 Jan


  • Crypto hardware
  • Differential cryptanalysis
  • Scan-based discrete Fourier transform (DFT)
  • Security
  • Side channel attack
  • Testability

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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