Abstract
An erbium-doped silicon transistor prepared by ion implantation and co-doped with oxygen is investigated by photocurrent generation in the telecommunication range. The photocurrent is explored at room temperature as a function of the wavelength by using a supercontinuum laser source working in the µW range. The 1-µm 2 transistor is tuned to involve in the transport only those electrons lying in the Er-O states. The spectrally resolved photocurrent is characterized by the typical absorption line of erbium and the linear dependence of the signal over the impinging power demonstrates that the Er-doped transistor is operating far from saturation. The relatively small number of estimated photoexcited atoms (≈4 × 10 4 ) makes Er-dpoed silicon potentially suitable for designing resonance-based frequency selective single photon detectors at 1550 nm.
Original language | English |
---|---|
Article number | 416 |
Journal | Nanomaterials |
Volume | 9 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2019 Mar |
Keywords
- Erbium
- Photocurrent
- Silicon transistor
ASJC Scopus subject areas
- Chemical Engineering(all)
- Materials Science(all)