Abstract
This paper presents an algorithm framework for the scan-chain optimization problem in multiple-scan design methodology. It also presents algorithms we propose based on the framework; these are the first algorithms ever proposed for multiple-scan designing. Experiments using actual design data show that, for ten scan-paths, our algorithms achieved a 90% reduction in scan-test time at the expense of a 7% total scan-path length increase as compared with the length of a single optimized scan-path.
| Original language | English |
|---|---|
| Pages | 301-306 |
| Number of pages | 6 |
| Publication status | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1998 3rd Conference of the Asia and South Pacific Design Automation (ASP-DAC '98) - Yokohama, Jpn Duration: 1998 Feb 10 → 1998 Feb 13 |
Other
| Other | Proceedings of the 1998 3rd Conference of the Asia and South Pacific Design Automation (ASP-DAC '98) |
|---|---|
| City | Yokohama, Jpn |
| Period | 98/2/10 → 98/2/13 |
ASJC Scopus subject areas
- Computer Science Applications
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering