Secure scan design using improved random order and its evaluations

Masaru Oya; Yuta Atobe; Youhua Shi; Masao Yanagisawa; Nozomu Togawa

doi:10.1109/APCCAS.2014.7032842

Secure scan design using improved random order and its evaluations

Masaru Oya, Yuta Atobe, Youhua Shi, Masao Yanagisawa, Nozomu Togawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

Scan test using scan chains is one of the most important DFT techniques. However, scan-based attacks are reported which can retrieve the secret key in crypto circuits by using scan chains. Secure scan architecture is strongly required to protect scan chains from scan-based attacks. This paper proposes an improved version of random order as a secure scan architecture. In improved random order, a scan chain is partitioned into multiple sub-chains. The structure of the scan chain changes dynamically by selecting a subchain to scan out. Testability and security of the proposed improved random order are also discussed in the paper, and the implementation results demonstrate the effectiveness of the proposed method.

Original language	English
Title of host publication	2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	555-558
Number of pages	4
Edition	February
ISBN (Electronic)	9781479952304
DOIs	https://doi.org/10.1109/APCCAS.2014.7032842
Publication status	Published - 2015 Feb 5
Event	2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014 - Ishigaki Island, Okinawa, Japan Duration: 2014 Nov 17 → 2014 Nov 20

Publication series

Name	IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
Number	February
Volume	2015-February

Other

Other	2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014
Country/Territory	Japan
City	Ishigaki Island, Okinawa
Period	14/11/17 → 14/11/20

Keywords

scan chains
scan-based attack
secure cryptro circuit
secure scan architecture

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/APCCAS.2014.7032842

Cite this

Oya, M., Atobe, Y., Shi, Y., Yanagisawa, M., & Togawa, N. (2015). Secure scan design using improved random order and its evaluations. In 2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014 (February ed., pp. 555-558). Article 7032842 (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS; Vol. 2015-February, No. February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APCCAS.2014.7032842

Secure scan design using improved random order and its evaluations. / Oya, Masaru; Atobe, Yuta; Shi, Youhua et al.
2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014. February. ed. Institute of Electrical and Electronics Engineers Inc., 2015. p. 555-558 7032842 (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS; Vol. 2015-February, No. February).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Oya, M, Atobe, Y, Shi, Y , Yanagisawa, M & Togawa, N 2015, Secure scan design using improved random order and its evaluations. in 2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014. February edn, 7032842, IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS, no. February, vol. 2015-February, Institute of Electrical and Electronics Engineers Inc., pp. 555-558, 2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014, Ishigaki Island, Okinawa, Japan, 14/11/17. https://doi.org/10.1109/APCCAS.2014.7032842

Oya M, Atobe Y, Shi Y , Yanagisawa M , Togawa N. Secure scan design using improved random order and its evaluations. In 2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014. February ed. Institute of Electrical and Electronics Engineers Inc. 2015. p. 555-558. 7032842. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS; February). doi: 10.1109/APCCAS.2014.7032842

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title = "Secure scan design using improved random order and its evaluations",

abstract = "Scan test using scan chains is one of the most important DFT techniques. However, scan-based attacks are reported which can retrieve the secret key in crypto circuits by using scan chains. Secure scan architecture is strongly required to protect scan chains from scan-based attacks. This paper proposes an improved version of random order as a secure scan architecture. In improved random order, a scan chain is partitioned into multiple sub-chains. The structure of the scan chain changes dynamically by selecting a subchain to scan out. Testability and security of the proposed improved random order are also discussed in the paper, and the implementation results demonstrate the effectiveness of the proposed method.",

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AB - Scan test using scan chains is one of the most important DFT techniques. However, scan-based attacks are reported which can retrieve the secret key in crypto circuits by using scan chains. Secure scan architecture is strongly required to protect scan chains from scan-based attacks. This paper proposes an improved version of random order as a secure scan architecture. In improved random order, a scan chain is partitioned into multiple sub-chains. The structure of the scan chain changes dynamically by selecting a subchain to scan out. Testability and security of the proposed improved random order are also discussed in the paper, and the implementation results demonstrate the effectiveness of the proposed method.

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Secure scan design using improved random order and its evaluations

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