Self-timed dynamic sensing scheme for 5 V only multi-Mb flash E2PROMs

Kazuo Kobayashi*, Takeshi Nakayama, Masanori Hayashikoshi, Yoshikazu Miyawaki, Yasushi Terada, Hideaki Arima, Takayuki Matsukawa, Tsutomu Yoshihara

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


A novel sensing scheme for high-density and high-speed sensing with a sub-10-μA cell current is presented. A source biasing method, which enhances the cell current drivability, and dynamic flip-flop sense amplifiers, in which a reference level is generated on the unselected bit lines with dummy cells, realize the high-speed and low-power operation. The potential of the dummy column is detected to control the sense amplifiers and decoders in a self-timed manner. Simulated results ensure the effectiveness of this sensing scheme for 5-V-only megabit flash E2PROMs (electrically erasable and programmable ROMs).

Original languageEnglish
Title of host publicationSymp VLSI Circuit 1989
Editors Anon
Place of PublicationPiscataway, NJ, United States
PublisherPubl by IEEE
Number of pages2
Publication statusPublished - 1989
Externally publishedYes
EventSymposium on VLSI Circuits 1989 - Kyoto, Japan
Duration: 1989 May 251989 May 27


OtherSymposium on VLSI Circuits 1989
CityKyoto, Japan

ASJC Scopus subject areas

  • General Engineering


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