Single grain and single grain boundary resistance of pentacene thin film characterized using a nanoscale electrode array

Tomohiko Edura*, Hiromasa Takahashi, Masashi Nakata, Harumasa Onozato, Jun Mizuno, Ken Tsutsui, Masamitsu Haemori, Kenji Itaka, Hideomi Koinuma, Yasuo Wada

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

In this paper, we report on a less than 100-nm-wide nanoscale electrode array, with which the field-effect mobilities of a single grain and a single grain boundary in organic thin films are characterized. The method of fabricating the nanoscale electrode array and the evaluation results of the pentacene thin film are described. The nanoscale electrode array was fabricated by EB lithography and a liftoff process. The pentacene thin film was deposited by molecular-beam epitaxy (MBE). The resistances of a single grain and a single grain boundary were estimated to be around 10 and 100 MΩ, respectively, and the field-effect mobility was estimated to be around 1 cm2/(V s), which is almost comparable to the highest value ever reported. These results confirm that a single crystal is essential for high performance organic thin-film transistors.

Original languageEnglish
Pages (from-to)3708-3711
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number4 B
DOIs
Publication statusPublished - 2006 Apr 25

Keywords

  • Field-effect mobility
  • Nanoscale electrode array
  • Organic thin-film transistor
  • Pentacene
  • Resistance
  • Single grain
  • Single grain boundary

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Single grain and single grain boundary resistance of pentacene thin film characterized using a nanoscale electrode array'. Together they form a unique fingerprint.

Cite this