Abstract
This paper presents a technique for writing submicron magnetic bit patterns on double-layered perpendicular recording media by using a Scanning Tunneling Microscope (STM) with an amorphous magnetic tip and observing them with a Magnetic Force Microscope (MFM). The proposed technique provides a very small tip-to-medium spacing on the order of Angstroms.
Original language | English |
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Pages (from-to) | 5289-5291 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 27 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1991 Nov |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering