This paper presents a technique for writing submicron magnetic bit patterns on double-layered perpendicular recording media by using a Scanning Tunneling Microscope (STM) with an amorphous magnetic tip and observing them with a Magnetic Force Microscope (MFM). The proposed technique provides a very small tip-to-medium spacing on the order of Angstroms.
|Number of pages||3|
|Journal||IEEE Transactions on Magnetics|
|Publication status||Published - 1991 Nov|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering