SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM.

Masahiko Yoshimoto*, Kenji Anami, Hirofumi Shinohara, Yoshihiro Hirata, Tsutomu Yoshihara, Takao Nakano

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

9 Citations (Scopus)
Original languageEnglish
Pages69-73
Number of pages5
DOIs
Publication statusPublished - 1983
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering

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