Soft X-ray emission and absorption spectroscopy in the Si L region of polysilanes

Y. Muramatsu*, M. Fujino, T. Yamamoto, E. M. Gullikson, R. C.C. Perera

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Soft X-ray emission and absorption spectra in the Si L region of a number of substituted polysilanes, (SiR2)n, have been obtained using synchrotron radiation to investigate their electronic structures. Studied polysilanes were substituted with methyl (R = CH3), ethyl (C2H5), propyl (n-C3H7), butyl (n-C4H9), pentyl (n-C5H11) and phenyl (C6H5) groups. Although similar spectral features in both X-ray emission and absorption are observed among alkyl-substituted polysilanes, slight differences are distinguished between alkyl- and phenyl-substituted ones. These spectral features are qualitatively reproduced by summing calculated density-of-state spectra for Si3s- and Si3d-orbitals. Thus, spectral features are explained through the hybridization of electronic orbitals in both backbone Si atoms and substituent C atoms.

Original languageEnglish
Pages (from-to)260-264
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Publication statusPublished - 2003 Jan
Externally publishedYes

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation


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