Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki; Yu Miyazawa; Daisuke Kobayashi; Masashi Ikegami; Tsutomu Miyasaka; Tomoyuki Yamamoto; Kazuyuki Hirose

doi:10.1109/PVSC.2017.8366357

Soft X-ray irradiation effect on surface structure of CH₃NH₃PbI₃ perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

School of Fundamental Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Soft X-ray exposure effects on CH3NH3PM3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH₃PM₃ to PbI₂ due to evaporation of methylammonium iodide.

Original language	English
Title of host publication	2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2084-2086
Number of pages	3
ISBN (Electronic)	9781509056057
DOIs	https://doi.org/10.1109/PVSC.2017.8366357
Publication status	Published - 2017
Event	44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States Duration: 2017 Jun 25 → 2017 Jun 30

Publication series

Name	2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other	44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Country/Territory	United States
City	Washington
Period	17/6/25 → 17/6/30

Keywords

CHNHPbI
Organic-inorganic hybrid perovskite
PbI
X-ray irradiation

ASJC Scopus subject areas

Renewable Energy, Sustainability and the Environment
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/PVSC.2017.8366357

Cite this

Motoki, K., Miyazawa, Y., Kobayashi, D., Ikegami, M., Miyasaka, T., Yamamoto, T., & Hirose, K. (2017). Soft X-ray irradiation effect on surface structure of CH₃NH₃PbI₃ perovskite in multi-film stack device. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 2084-2086). (2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366357

Soft X-ray irradiation effect on surface structure of CH₃NH₃PbI₃ perovskite in multi-film stack device. / Motoki, Keisuke; Miyazawa, Yu; Kobayashi, Daisuke et al.
2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 2084-2086 (2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Motoki, K, Miyazawa, Y, Kobayashi, D, Ikegami, M, Miyasaka, T, Yamamoto, T & Hirose, K 2017, Soft X-ray irradiation effect on surface structure of CH₃NH₃PbI₃ perovskite in multi-film stack device. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers Inc., pp. 2084-2086, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 17/6/25. https://doi.org/10.1109/PVSC.2017.8366357

Motoki K, Miyazawa Y, Kobayashi D, Ikegami M, Miyasaka T, Yamamoto T et al. Soft X-ray irradiation effect on surface structure of CH₃NH₃PbI₃ perovskite in multi-film stack device. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 2084-2086. (2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017). doi: 10.1109/PVSC.2017.8366357

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abstract = "Soft X-ray exposure effects on CH3NH3PM3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PM3 to PbI2 due to evaporation of methylammonium iodide.",

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