Some advanced semiconductor production-inventory management systems and their performances

Hiroshi Katayama*, Jun Nakazato, Seiji Ishikawa, Masayoshi Ishii

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review


    The critical issues of memory chip manufacturing management are the fluctuation of manufacturing yield rates and demand quantity. To cope with these problems generated by such uncertainty, this paper deals with two types of advanced production-inventory management system of memory chip fabrication, which consist of yield estimation, repairing operation of inferior goods and adjustment procedure of production quantities based on the production quantity planning procedure with in-process buffer. Quantitative characteristics of the proposed systems are investigated through simulation experiments and comparison analysis between current and proposed systems Is performed to clarify their relevancy.

    Original languageEnglish
    Pages (from-to)705-708
    Number of pages4
    JournalComputers and Industrial Engineering
    Issue number3-4
    Publication statusPublished - 1997 Dec


    • In-process Inventory Control
    • Particle Detection
    • Semiconductor
    • Yield Estimation

    ASJC Scopus subject areas

    • Information Systems and Management
    • Management Science and Operations Research
    • Industrial and Manufacturing Engineering
    • Applied Mathematics


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