Abstract
Side-mode suppression ratio and main-mode wavelength were measured in the 3000 h life test of 1.55 μn λ/4-shifted InGaAsP/InP DFB lasers. Degradation of the single-wavelength property and the wavelength shift of the main mode were observed in lasers which showed relatively large degradation rates of about 10-4/h at 50°C. Indexing term: Semiconductor lasers.
Original language | English |
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Pages (from-to) | 316-318 |
Number of pages | 3 |
Journal | Electronics Letters |
Volume | 23 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1987 Jan 1 |
Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering