Standard materials and metrology for nanotechnology (SMAM-2)

Shingo Ichimura; Tomizo Kurosawa; Toshiyuki Fujimoto; Hidehiko Nonaka

doi:10.1088/0957-0233/18/9/E01

Standard materials and metrology for nanotechnology (SMAM-2)

Shingo Ichimura^*, Tomizo Kurosawa, Toshiyuki Fujimoto, Hidehiko Nonaka

^*Corresponding author for this work

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Journal	Measurement Science and Technology
Volume	18
Issue number	9
DOIs	https://doi.org/10.1088/0957-0233/18/9/E01
Publication status	Published - 2007 Sept 1
Externally published	Yes

ASJC Scopus subject areas

Instrumentation
Engineering (miscellaneous)
Applied Mathematics

Access to Document

10.1088/0957-0233/18/9/E01

Cite this

@article{a4a8109d76364a56957b1f95d8bb0529,

title = "Standard materials and metrology for nanotechnology (SMAM-2)",

author = "Shingo Ichimura and Tomizo Kurosawa and Toshiyuki Fujimoto and Hidehiko Nonaka",

year = "2007",

month = sep,

day = "1",

doi = "10.1088/0957-0233/18/9/E01",

language = "English",

volume = "18",

journal = "Measurement Science and Technology",

issn = "0957-0233",

publisher = "IOP Publishing Ltd.",

number = "9",

}

TY - JOUR

T1 - Standard materials and metrology for nanotechnology (SMAM-2)

AU - Ichimura, Shingo

AU - Kurosawa, Tomizo

AU - Fujimoto, Toshiyuki

AU - Nonaka, Hidehiko

PY - 2007/9/1

Y1 - 2007/9/1

UR - http://www.scopus.com/inward/record.url?scp=36448944748&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=36448944748&partnerID=8YFLogxK

U2 - 10.1088/0957-0233/18/9/E01

DO - 10.1088/0957-0233/18/9/E01

M3 - Editorial

AN - SCOPUS:36448944748

SN - 0957-0233

VL - 18

JO - Measurement Science and Technology

JF - Measurement Science and Technology

IS - 9

ER -

Standard materials and metrology for nanotechnology (SMAM-2)

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this