Standardization of measurement and characterization for nanotechnology: Recent trend and roadmap

Shingo Ichimura

doi:10.3131/jvsj2.56.249

Standardization of measurement and characterization for nanotechnology: Recent trend and roadmap

Shingo Ichimura^*

^*Corresponding author for this work

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Pages (from-to)	249-251
Number of pages	3
Journal	Journal of the Vacuum Society of Japan
Volume	56
Issue number	7
DOIs	https://doi.org/10.3131/jvsj2.56.249
Publication status	Published - 2013 Sept 3
Externally published	Yes

ASJC Scopus subject areas

Materials Science(all)
Instrumentation
Surfaces and Interfaces
Spectroscopy

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10.3131/jvsj2.56.249

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title = "Standardization of measurement and characterization for nanotechnology: Recent trend and roadmap",

author = "Shingo Ichimura",

year = "2013",

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pages = "249--251",

journal = "Journal of the Vacuum Society of Japan",

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number = "7",

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JO - Journal of the Vacuum Society of Japan

JF - Journal of the Vacuum Society of Japan

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Standardization of measurement and characterization for nanotechnology: Recent trend and roadmap

ASJC Scopus subject areas

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