Stm observation of electroless-plated cobalt alloy thin films

Tetsuya Osaka, Takayuki Homma, Kingo Itaya, Shizuo Sugawara

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.

Original languageEnglish
Pages (from-to)L465-L467
JournalJapanese journal of applied physics
Issue number3 A
Publication statusPublished - 1989 Mar


  • Electroless-plating
  • Microstructure
  • Perpendicular recording
  • STM

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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