Stm observation of electroless-plated cobalt alloy thin films

Tetsuya Osaka; Takayuki Homma; Kingo Itaya; Shizuo Sugawara

doi:10.1143/JJAP.28.L465

Stm observation of electroless-plated cobalt alloy thin films

Tetsuya Osaka, Takayuki Homma, Kingo Itaya, Shizuo Sugawara

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.

Original language	English
Pages (from-to)	L465-L467
Journal	Japanese journal of applied physics
Volume	28
Issue number	3 A
DOIs	https://doi.org/10.1143/JJAP.28.L465
Publication status	Published - 1989 Mar

Keywords

Electroless-plating
Microstructure
Perpendicular recording
STM

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.28.L465

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title = "Stm observation of electroless-plated cobalt alloy thin films",

abstract = "The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.",

keywords = "Electroless-plating, Microstructure, Perpendicular recording, STM",

author = "Tetsuya Osaka and Takayuki Homma and Kingo Itaya and Shizuo Sugawara",

year = "1989",

month = mar,

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language = "English",

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T1 - Stm observation of electroless-plated cobalt alloy thin films

AU - Osaka, Tetsuya

AU - Homma, Takayuki

AU - Itaya, Kingo

AU - Sugawara, Shizuo

PY - 1989/3

Y1 - 1989/3

N2 - The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.

AB - The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.

KW - Electroless-plating

KW - Microstructure

KW - Perpendicular recording

KW - STM

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JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 3 A

ER -

Stm observation of electroless-plated cobalt alloy thin films

Abstract

Keywords

ASJC Scopus subject areas

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