Stress release drives growth transition of quaterrylene thin films on Sio2 surfaces

Chemical Compounds

• Quaterrylene 100%
• Field Effect 26%
• X-Ray Diffraction 26%
• Atomic Force Microscopy 20%
• Monolayer 19%
• Surface 16%
• Liquid Film 12%

Engineering & Materials Science

• Thin films 50%
• Compressive stress 22%
• X ray diffraction 20%
• Organic field effect transistors 17%
• Carrier transport 16%
• Lattice constants 15%
• Monolayers 13%
• Atomic force microscopy 13%

Physics & Astronomy

• thin films 27%
• diffraction 11%
• grazing incidence 11%
• x rays 9%
• field effect transistors 8%
• atomic force microscopy 8%
• expansion 6%
• cells 5%