Structural and morphological control of nanosized Cu islands on SiO 2 using a Ti underlayer

Minghui Hu*, Suguru Noda, Tatsuya Okubo, Yukio Yamaguchi, Hiroshi Komiyama

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

The structural and morphological control of nanosized Cu islands on SiO2 using a Ti underlayer were discussed. It was found that the Cu islands on Ti/SiO2 possessed smaller sizes, shorter interisland distance and a higher number density that those on SiO2. The analysis suggested the fabrication of nanosized islands with the desired wettability and crystalline orientation using an appropriate metal underlayer.

Original languageEnglish
Pages (from-to)3492-3497
Number of pages6
JournalJournal of Applied Physics
Volume94
Issue number5
DOIs
Publication statusPublished - 2003 Sept 1
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Structural and morphological control of nanosized Cu islands on SiO 2 using a Ti underlayer'. Together they form a unique fingerprint.

Cite this