Abstract
Direct observation of ZnSe-ZnTe strained layer superlattice was performed by transmission electron microscopy. The long periodicity of the superlattice was confirmed by the satellite spots of transmissin electron diffraction. The bright field TEM image indicated the superlattice structure without large scale misfit dislocations.
Original language | English |
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Pages (from-to) | 277-278 |
Number of pages | 2 |
Journal | Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E |
Volume | E69 |
Issue number | 4 |
Publication status | Published - 1986 Apr |
Externally published | Yes |
Event | Pap from 1986 Natl Conv IECE Jpn - Niigata, Jpn Duration: 1986 Mar 23 → 1986 Mar 26 |
ASJC Scopus subject areas
- Engineering(all)