Structures and optical properties of defects correlated with photo-induced refractive index changes in Ge-doped SiO2 glass

Makoto Fujimaki; Yoshimichi Ohki

Structures and optical properties of defects correlated with photo-induced refractive index changes in Ge-doped SiO₂ glass

Makoto Fujimaki, Yoshimichi Ohki

School of Advanced Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Photosensitivity of Ge-doped SiO₂ glass is closely related to defect formation with ultraviolet photon irradiation. In the present paper, optical properties of Ge oxygen deficient centers, which are involved in the defect formation, are reviewed. Furthermore, structures and generation mechanisms of the photo-induced defects are discussed.

Original language	English
Pages (from-to)	43-50
Number of pages	8
Journal	Diffusion and Defect Data. Pt A Defect and Diffusion Forum
Volume	177
Publication status	Published - 2000 Jan 1

ASJC Scopus subject areas

Radiation
Materials Science(all)
Condensed Matter Physics

Cite this

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title = "Structures and optical properties of defects correlated with photo-induced refractive index changes in Ge-doped SiO2 glass",

abstract = "Photosensitivity of Ge-doped SiO2 glass is closely related to defect formation with ultraviolet photon irradiation. In the present paper, optical properties of Ge oxygen deficient centers, which are involved in the defect formation, are reviewed. Furthermore, structures and generation mechanisms of the photo-induced defects are discussed.",

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AU - Fujimaki, Makoto

AU - Ohki, Yoshimichi

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N2 - Photosensitivity of Ge-doped SiO2 glass is closely related to defect formation with ultraviolet photon irradiation. In the present paper, optical properties of Ge oxygen deficient centers, which are involved in the defect formation, are reviewed. Furthermore, structures and generation mechanisms of the photo-induced defects are discussed.

AB - Photosensitivity of Ge-doped SiO2 glass is closely related to defect formation with ultraviolet photon irradiation. In the present paper, optical properties of Ge oxygen deficient centers, which are involved in the defect formation, are reviewed. Furthermore, structures and generation mechanisms of the photo-induced defects are discussed.

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ER -

Structures and optical properties of defects correlated with photo-induced refractive index changes in Ge-doped SiO₂ glass

Abstract

ASJC Scopus subject areas

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