Study of flicker noise in n- and p-MOSFETs with ultra-thin gate oxide in the direct-tunneling regime

Hisayo Sasaki Momose*, Hideki Kimijima, Shin ichiro Ishizuka, Yasunori Miyahara, Tatsuya Ohguro, Takashi Yoshitomi, Eiji Morifuji, Shin ichi Nakamura, Toyota Morimoto, Yasuhiro Katsumata, Hiroshi Iwai

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

25 Citations (Scopus)

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