Abstract
In this study, a new CoNiFe thin film was prepared from the bath with organic additive in order to increase resistivity. Resistivity value was measured by a four-probe method, while the film composition was analyzed by the X-ray fluorescence (XRF). The crystal structure was characterized by X-ray diffraction (XRD, Fe-Kα).
Original language | English |
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Pages (from-to) | GQ-01 |
Journal | Digests of the Intermag Conference |
Publication status | Published - 1999 |
Event | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea Duration: 1999 May 18 → 1999 May 21 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering