Study on sliding-window length based on Rayleigh backscattering spectrum correlation in distributed optical-fiber strain measurement

Liujia Suo, Zhenkun Lei, Shiyuan Zhao, Zhanjun Wu*, Akihiro Takezawa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


A theoretical model is established for estimating the strain measurement error based on the Rayleigh backscattering spectrum correlation in distributed optical fiber strain measurements. Assuming the signal is much larger than the noise, the theoretical model predicts the strain measurement error using noise variance and the defined quality factor Q of the Rayleigh backscattering spectrum. Furthermore, an algorithm based on the quality factor Q is proposed to select an optimized sliding-window. The sliding-window length can be obtained by calculating the threshold value of the quality factor using a theoretical model corresponding to the required strain measurement accuracy. Compared with the traditional method where the sliding-window length is defined by the user based on spatial resolution requirements or an empirical definition, the sliding-window length determined by the algorithm is more reasonable and can be automatically defined, alleviating the requirement for user inputs. To verify the correctness of the theoretical model, two experiments are set up: a self-correlation experiment, that analyzes the effect of the quality factor on the strain measurement accuracy, and a virtual experiment of the noise influence, which analyzes the effect of different noise variances. The experimental results are in good agreement with those of the model.

Original languageEnglish
Pages (from-to)126-132
Number of pages7
JournalOptical Fiber Technology
Publication statusPublished - 2019 Jan
Externally publishedYes


  • Distributed optical fiber strain measurement
  • Optical frequency domain reflectometer
  • Rayleigh backscattering spectrum correlation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electrical and Electronic Engineering


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