Supramolecular thin film architectures for photonic applications

Rigoberto Advincula; Curtis W. Frank; Daniel Roitman; Jim Sheats; Ron Moon; Wolfgang Knoll

Supramolecular thin film architectures for photonic applications

Rigoberto Advincula, Curtis W. Frank, Daniel Roitman, Jim Sheats, Ron Moon, Wolfgang Knoll

Research output: Contribution to journal › Article › peer-review

Abstract

We report on the fabrication and characterization of electroluminescent devices based on a thin film preparation strategy that involves the alternate polyelectrolyte deposition from aqueous solution for the hole injection/ transporting layer combined with a conventional spin-cast method for the luminescent layer (MEH-PPV). Surface plasmon optical techniques are used to monitor the deposition process in-situ, as well as to quantify structural parameters of the final multilayer assemblies. These data are complemented by UV-vis spectroscopy, and X-ray reflectivity measurements. The final devices are functionally characterized in terms of their current-voltage, as well as their luminance-voltage performance.

Original language	English
Pages (from-to)	103-112
Number of pages	10
Journal	Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals
Volume	316
Publication status	Published - 1998
Externally published	Yes

Keywords

Alternate Polyelectrolyte Deposition
Electroluminescence
Organic Thin Films
Photonics
Polymer Light Emitting Devices

ASJC Scopus subject areas

Condensed Matter Physics

Cite this

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title = "Supramolecular thin film architectures for photonic applications",

abstract = "We report on the fabrication and characterization of electroluminescent devices based on a thin film preparation strategy that involves the alternate polyelectrolyte deposition from aqueous solution for the hole injection/ transporting layer combined with a conventional spin-cast method for the luminescent layer (MEH-PPV). Surface plasmon optical techniques are used to monitor the deposition process in-situ, as well as to quantify structural parameters of the final multilayer assemblies. These data are complemented by UV-vis spectroscopy, and X-ray reflectivity measurements. The final devices are functionally characterized in terms of their current-voltage, as well as their luminance-voltage performance.",

keywords = "Alternate Polyelectrolyte Deposition, Electroluminescence, Organic Thin Films, Photonics, Polymer Light Emitting Devices",

author = "Rigoberto Advincula and Frank, {Curtis W.} and Daniel Roitman and Jim Sheats and Ron Moon and Wolfgang Knoll",

year = "1998",

language = "English",

volume = "316",

pages = "103--112",

journal = "Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals",

issn = "1058-725X",

publisher = "Taylor and Francis Ltd.",

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T1 - Supramolecular thin film architectures for photonic applications

AU - Advincula, Rigoberto

AU - Frank, Curtis W.

AU - Roitman, Daniel

AU - Sheats, Jim

AU - Moon, Ron

AU - Knoll, Wolfgang

PY - 1998

Y1 - 1998

N2 - We report on the fabrication and characterization of electroluminescent devices based on a thin film preparation strategy that involves the alternate polyelectrolyte deposition from aqueous solution for the hole injection/ transporting layer combined with a conventional spin-cast method for the luminescent layer (MEH-PPV). Surface plasmon optical techniques are used to monitor the deposition process in-situ, as well as to quantify structural parameters of the final multilayer assemblies. These data are complemented by UV-vis spectroscopy, and X-ray reflectivity measurements. The final devices are functionally characterized in terms of their current-voltage, as well as their luminance-voltage performance.

AB - We report on the fabrication and characterization of electroluminescent devices based on a thin film preparation strategy that involves the alternate polyelectrolyte deposition from aqueous solution for the hole injection/ transporting layer combined with a conventional spin-cast method for the luminescent layer (MEH-PPV). Surface plasmon optical techniques are used to monitor the deposition process in-situ, as well as to quantify structural parameters of the final multilayer assemblies. These data are complemented by UV-vis spectroscopy, and X-ray reflectivity measurements. The final devices are functionally characterized in terms of their current-voltage, as well as their luminance-voltage performance.

KW - Alternate Polyelectrolyte Deposition

KW - Electroluminescence

KW - Organic Thin Films

KW - Photonics

KW - Polymer Light Emitting Devices

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SN - 1058-725X

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JO - Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

JF - Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

ER -

Supramolecular thin film architectures for photonic applications

Abstract

Keywords

ASJC Scopus subject areas

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