Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

H. Nakamura; N. Fujihara; M. Nojima; K. Tamura; H. Ishii; M. Owari; C. Oshima; Y. Nihei

doi:10.1002/sia.1935

Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

H. Nakamura, N. Fujihara, M. Nojima, K. Tamura, H. Ishii, M. Owari, C. Oshima, Y. Nihei^*

^*Corresponding author for this work

Waseda University

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.

Original language	English
Pages (from-to)	1513-1515
Number of pages	3
Journal	Surface and Interface Analysis
Volume	36
Issue number	12
DOIs	https://doi.org/10.1002/sia.1935
Publication status	Published - 2004 Dec

Keywords

Circular pattern
Kikuchi-like band
Light elements
X-ray photoelectron diffraction

ASJC Scopus subject areas

Physical and Theoretical Chemistry
Colloid and Surface Chemistry

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10.1002/sia.1935

Cite this

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title = "Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction",

abstract = "For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.",

keywords = "Circular pattern, Kikuchi-like band, Light elements, X-ray photoelectron diffraction",

author = "H. Nakamura and N. Fujihara and M. Nojima and K. Tamura and H. Ishii and M. Owari and C. Oshima and Y. Nihei",

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T1 - Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

AU - Nakamura, H.

AU - Fujihara, N.

AU - Nojima, M.

AU - Tamura, K.

AU - Ishii, H.

AU - Owari, M.

AU - Oshima, C.

AU - Nihei, Y.

PY - 2004/12

Y1 - 2004/12

N2 - For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.

AB - For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.

KW - Circular pattern

KW - Kikuchi-like band

KW - Light elements

KW - X-ray photoelectron diffraction

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Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

Abstract

Keywords

ASJC Scopus subject areas

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